.
Education
Ph.D. 1982, Chemistry, University of Washington
B.S. 1977, Chemistry, Oregon State University
Research Interests
Click here.
Selected Publications
R. Turakhia, T. Shannon, R. Daasch, B. Benware, B. Madge, "Defect Screening Using Independent Component Analysis on IDDQ," IEEE VLSI Test Symposium, 2005.
X. Haiqiao, R. Schaumann, R. Daasch, P.K. Wong, B. Pejcinovic, "A radio-frequency CMOS active inductor and its application in designing high-Q filters," Proceedings International Symposium on Circuits and Systems, pp. 197-200, 2004.
C. Schuermyer, J. Ruffler, R. Daasch, R. Madge, "Minimum testing requirements to screen temperature dependent defects," Proceedings International Test Conference, pp. 300-308, 2004.
R. Madge, B. Benware, R. Turakhia, R. Daasch, C. Schuermyer, J. Ruffler, "In search of the optimum test set-adaptive test methods for maximum defect coverage and lowest test cost," Proceedings International Test Conference, pp. 203-212, 2004.
R. Daasch, M. Rehani, "Dude! where's my data? - cracking open the hermetically sealed tester," Proceedings International Test Conference, 2004, panel session, p. 1428, 2004.
E. Long, R. Daasch, R. Madge, B. Benware, "Detection of temperature sensitive defects using ZTC," IEEE VLSI Test Symposium, pp. 185-190, 2004.
C. Schuermyer, B. Benware, K. Cota, R. Madge, R. Daasch, L. Ning, "Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ," International Test Conference, pp. 565-573, 2003.
R. Madge, B. Benware, R. Daasch, "Obtaining High Defect Coverage for Frequency Dependent Defects on Complex ASICs," IEEE Design and Test of Computers, pp. 46-53, 2003.
